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- Titel:
Robust Pattern Generation for Small Delay Faults under Process Variations
- Dokumenttyp:
- Konferenzbeitrag
- Autor(en):
- Jafarzadeh, Hanieh; Klemme, Florian; Dennis Reimer, Jan; Paria Najafi Haghi, Zahra; Amrouch, Hussam; Hellebrand, Sybille; Wunderlich, Hans-Joachim
- Kongress- / Buchtitel:
- IEEE International Test Conference (ITC)
- Jahr:
- 2023
- Monat:
- Oct.
BibTeX
Vorkommen:
- mediaTUM GesamtbestandHochschulbibliographie2023Integrated Research CentersMunich Institute of Robotics and Machine Intelligence (MIRMI)
- mediaTUM GesamtbestandEinrichtungenSchools TUM School of Computation, Information and TechnologyDepartmentsComputer EngineeringAI Processor Design (Prof. Amrouch)