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- Titel:
Monolithic 3D Integrated BEOL Dual-Port Ferroelectric FET to Break the Tradeoff Between the Memory Window and the Ferroelectric Thickness
- Dokumenttyp:
- Konferenzbeitrag
- Autor(en):
- Prakash, Om; Ni, Kai; Amrouch, Hussam
- Kongress- / Buchtitel:
- 2023 IEEE International Reliability Physics Symposium (IRPS)
- Jahr:
- 2023
- Monat:
- 03
- Seiten:
- 1-4
- Volltext / DOI:
- doi:10.1109/IRPS48203.2023.10118286
BibTeX
Vorkommen:
- mediaTUM GesamtbestandHochschulbibliographie2023Integrated Research CentersMunich Institute of Robotics and Machine Intelligence (MIRMI)
- mediaTUM GesamtbestandEinrichtungenSchools TUM School of Computation, Information and TechnologyDepartmentsComputer EngineeringAI Processor Design (Prof. Amrouch)