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- Author(s):
- Fischer, T.; Amirante, E.; Hofmann, K.; Ostermayr, M.; Huber, P.; Schmitt-Landsiedel, D.
- Title:
- A 65nm test structure for the analysis of NBTI induced statistical variation in SRAM transistors
- Book / Congress title:
- IEEE Proceedings of 38th European Solid-State Device Research Conference ESSDERC
- Year:
- 2008
- Month:
- 15-19 Sept.
- Pages:
- 51-54
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