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Kraus, W.
Einfluss von Gate-Tunnelströmen auf Switched-Capacitor-Schaltungen
Shaker
2008
Weis, M.;Pfitzner, A.;Kasprowicz, D.;Emling, R.;Maly, W.;Schmitt-Landsiedel, D.
Circuit design with Independent Double Gate Transistors
Kleinheubacher Tagung
2008
Kraus, W.;Schmitt-Landsiedel, D.
Einfluss von Gate-Tunnelströmen auf SC-Integrierer
Kleinheubacher Tagung
2008
Franell, E.;Drueen, S.;Gossner, H.;Schmitt-Landsiedel, D.
ESD Full Chip Simulation -- HBM and CDM Requirements and Simulation Approach
Advances in Radio Science
2008
6
245-251
Eireiner, M.;Henzler, S.;Zhang, X.;Berthold, J.;Schmitt-Landsiedel, D.
Impact of On-Chip Inductance on Power Supply Integrity
Advances in Radio Science
2008
6
227-232
Drapatz, S.;Georgakos, G.;Schmitt-Landsiedel, D.
Einfluß von Negative und Positive Bias Temperature Stress auf 6T-SRAM Zellen
Kleinheubacher Tagung
2008
Baumann, T.;Schmitt-Landsiedel, Doris;Pacha, Christian
Impact of Technology and Microarchitecture on the Robustness of Embedded Low-Power Microprocessors
Kleinheubacher Tagung
2008
Eireiner, M.;Henzler, S.;Gopalakrishnan, K.;Schmitt-Landsiedel, D.
Supply noise Robustness of Building Blocks for Digital Power Supply Monitoring
Kleinheubacher Tagung
2008
Nirmaier, T.;Zaguirre, J.T.;Hong, E.;Spirkl, W.;Rettenberger, A.;Schmitt-Landsiedel, D.
Efficient High-Speed Interface Verification and Fault Analysis
Proc. IEEE International Test Conference ITC 2008
2008
Weis, M.;Pfitzner, A.;Ksprowicz, K.;Lin, Yi-Wei;Fischer, Th.;Emling, R.;Marek-Sadowska, M.;Schmitt-Landsiedel, D.;Maly, W.
Low Power SRAM Cell Using Vertical Slit Field Effect Transistor (VeSFET
European Solid-State Circuits Conference, ESSCIRC Fringe
2008
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