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- Titel:
A 65nm test structure for the analysis of NBTI induced statistical variation in SRAM transistors
- Autor(en):
- Fischer, T.; Amirante, E.; Hofmann, K.; Ostermayr, M.; Huber, P.; Schmitt-Landsiedel, D.
- Kongress- / Buchtitel:
- IEEE Proceedings of 38th European Solid-State Device Research Conference ESSDERC
- Jahr:
- 2008
- Monat:
- 15-19 Sept.
- Seiten:
- 51-54
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