Yan Li, Helmut Schneider, Florian Schnabel, Roland Thewes;Schmitt-Landsiedel, Doris
DRAM Yield Analysis and Optimization by a Statistical Design Approach
IEEE_J_CASI_RP
2011
58
12
dec
2906-2918

Wirnshofer, M.;Heiss, L.;Georgakos, G.;Schmitt-Landsiedel, D.
An energy-efficient supply voltage scheme using in-situ Pre-Error detection for on-the-fly voltage adaptation to PVT variations
Proc. 13th International Symposium on Integrated Circuits (ISIC)
2011

N. Pour Aryan, G. Georgakos, D. Schmitt-Landsiedel;Wirnshofer, M.
Comparison of In-situ Delay Monitors for Use in Adaptive Voltage Scaling
Kleinheubacher Tagung, Miltenberg
2011

Mucha, A;Schienle, M.;Schmitt-Landsiedel, D.
Sensing cellular adhesion with a CMOS integrated impedance-to-frequency converter
IEEE Sensors Applications Symposium (SAS)
2011

Mucha, A;Bohrn, U;Schienle, M.;Schmitt-Landsiedel, D.
A CMOS integrated cell adhesion sensor for lab-on-a-chip applications
Proceedings of Conference on Bioelectronics, Biomedical, and Bioinspired Systems Nanotechnology
2011

More, S.;Fulde, M.;Chouard, F;Schmitt-Landsiedel, D.
Reducing impact of degradation on analog circuits by chopper stabilization and autozeroing
International Symposium on Quality Electronic Design (ISQED)
2011

More, S.;Chouard, F;Yilmaz, C.;Fulde, M.;Schmitt-Landsiedel, D.
Aging Monitor and Compensation of Ring Oscillator Degradation
KHB
2011

More, S.;Chouard, F;Fulde, M.;Schmitt-Landsiedel, D.
Proof of Concept for Mitigation of Aging Induced Degradation in Differential Circuits using Chopper Stabilization
Proceedings of Austrochip Workshop
ISBN: 978-3-200-02384-0
2011

Lüders, M.;Eversmann, B.;Gerber, J.;Huber, K.;Kuhn, R.;Schmitt-Landsiedel, D.;Brederlow, R.
A fully-integrated system power aware LDO for energy harvesting applications
Symposium on VLSI Circuits (VLSIC)
2011

Li, Yan;Schneider, H.;Schnabel, F.;Thewes, R.;Schmitt-Landsiedel, D.
DRAM Yield Analysis and Optimization by a Statistical Design Approach
IEEE Transactions on Circuit and Systems I: Regular Papers
2011
58
12
2906-2918