- Author(s):
- Fischer, T.; Amirante, E.; Hofmann, K.; Ostermayr, M.; Huber, B.; Schmitt-Landsiedel, D.
- Title:
- Test structures for SRAM cell and device variability and the �statistics of NBTI degradation
- Book / Congress title:
- Workshop on Variation Test Structures at ICCAD
- Year:
- 2008
- Month:
- 13. Nov.
- BibTeX