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- Titel:
Test structures for SRAM cell and device variability and the �statistics of NBTI degradation
- Autor(en):
- Fischer, T.; Amirante, E.; Hofmann, K.; Ostermayr, M.; Huber, B.; Schmitt-Landsiedel, D.
- Kongress- / Buchtitel:
- Workshop on Variation Test Structures at ICCAD
- Jahr:
- 2008
- Monat:
- 13. Nov.
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