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Document type:
Konferenzbeitrag
Contribution type:
Vortrag / Präsentation
Author(s):
Fischer, Thomas
Title:
Statistical effects of NBTI degradation in SRAM cells
Book / Congress title:
Muneda User Group Meeting 2008
Congress (additional information):
München
Date of publication:
13.11.2008
Year:
2008
Language:
en
TUM Institution:
Lehrstuhl für Technische Elektronik
Format:
Text
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