- Title:
Statistical effects of NBTI degradation in SRAM cells
- Document type:
- Konferenzbeitrag
- Contribution type:
- Vortrag / Präsentation
- Author(s):
- Fischer, Thomas
- Book / Congress title:
- Muneda User Group Meeting 2008
- Congress (additional information):
- München
- Date of publication:
- 13.11.2008
- Year:
- 2008
- Language:
- en
- TUM Institution:
- Lehrstuhl für Technische Elektronik
- Format:
- Text
- BibTeX