Growth of broken crystals tracked in 4D using X-Ray computed tomography and its influence on impurity incorporation

Titel:: Growth of broken crystals tracked in 4D using X-Ray computed tomography and its influence on impurity incorporation
Dokumenttyp:: Zeitschriftenaufsatz
Autor(en):: Schiele, S.; Haider, T.; Briesen, H.
Zeitschriftentitel:: Scientific Reports
Jahr:: 2024
Band / Volume:: 14
Seitenangaben Beitrag:: 21999
Volltext / DOI:: doi:10.1038/s41598-024-73127-y
TUM Einrichtung:: Process Systems Engineering, TUM
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