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Title:

Near-Field to Far-Field Propagation of Correlation Information for Noisy Electromagnetic Fields

Document type:
Konferenzbeitrag
Contribution type:
Textbeitrag / Aufsatz
Author(s):
Haider, M.; Baev, A.; Kuznetsov, Y.; Russer, J.A.
Abstract:
Switching processes in digital circuits are a source of radiated electromagnetic interference (EMI). Emitted electromagnetic (EM) fields can be considered noisy fields from an EMI perspective. High-bit-rates and low power levels increase susceptibility of devices to EMI. Noise emitted by such devices and of the printed circuit board they are embedded in is usually of cyclostationary nature. In this contribution, we experimentally observe the cyclostationary behavior of those emissions based on b...     »
Keywords:
electromagnetic fields; electromagnetic interference; printed circuits; far-field measurements; far-field correlations; near-field measurement data; far-field propagation; correlation information; noisy electromagnetic fields; digital circuits; radiated electromagnetic interference; emitted electromagnetic fields; EMI perspective; high-bit-rates; low power levels; printed circuit board; cyclostationary nature; Correlation; Electromagnetic interference; Transmission line measurements; Method of m...     »
Book / Congress title:
2018 48th European Microwave Conference (EuMC)
Congress (additional information):
Madrid, Spain, 23-27 Sep 2018 2018-09
Publisher:
IEEE Xplore Digital Library
Year:
2018
Quarter:
3. Quartal
Year / month:
2018-09
Month:
Sep
Print-ISBN:
978-1-5386-5285-5
E-ISBN:
978-2-87487-051-4 978-2-87487-050-7
Language:
en
Fulltext / DOI:
doi:10.23919/EuMC.2018.8541636
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