Switching processes in digital circuits are a source of radiated electromagnetic interference (EMI). Emitted electromagnetic (EM) fields can be considered noisy fields from an EMI perspective. High-bit-rates and low power levels increase susceptibility of devices to EMI. Noise emitted by such devices and of the printed circuit board they are embedded in is usually of cyclostationary nature. In this contribution, we experimentally observe the cyclostationary behavior of those emissions based on both, near and far-field measurements and we numerically compute far-field correlations based on near-field measurement data.
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Switching processes in digital circuits are a source of radiated electromagnetic interference (EMI). Emitted electromagnetic (EM) fields can be considered noisy fields from an EMI perspective. High-bit-rates and low power levels increase susceptibility of devices to EMI. Noise emitted by such devices and of the printed circuit board they are embedded in is usually of cyclostationary nature. In this contribution, we experimentally observe the cyclostationary behavior of those emissions based on b...
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