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Titel:

Near-Field to Far-Field Propagation of Correlation Information for Noisy Electromagnetic Fields

Dokumenttyp:
Konferenzbeitrag
Art des Konferenzbeitrags:
Textbeitrag / Aufsatz
Autor(en):
Haider, M.; Baev, A.; Kuznetsov, Y.; Russer, J.A.
Abstract:
Switching processes in digital circuits are a source of radiated electromagnetic interference (EMI). Emitted electromagnetic (EM) fields can be considered noisy fields from an EMI perspective. High-bit-rates and low power levels increase susceptibility of devices to EMI. Noise emitted by such devices and of the printed circuit board they are embedded in is usually of cyclostationary nature. In this contribution, we experimentally observe the cyclostationary behavior of those emissions based on b...     »
Stichworte:
electromagnetic fields; electromagnetic interference; printed circuits; far-field measurements; far-field correlations; near-field measurement data; far-field propagation; correlation information; noisy electromagnetic fields; digital circuits; radiated electromagnetic interference; emitted electromagnetic fields; EMI perspective; high-bit-rates; low power levels; printed circuit board; cyclostationary nature; Correlation; Electromagnetic interference; Transmission line measurements; Method of m...     »
Kongress- / Buchtitel:
2018 48th European Microwave Conference (EuMC)
Kongress / Zusatzinformationen:
Madrid, Spain, 23-27 Sep 2018 2018-09
Verlag / Institution:
IEEE Xplore Digital Library
Jahr:
2018
Quartal:
3. Quartal
Jahr / Monat:
2018-09
Monat:
Sep
Print-ISBN:
978-1-5386-5285-5
E-ISBN:
978-2-87487-051-4 978-2-87487-050-7
Sprache:
en
Volltext / DOI:
doi:10.23919/EuMC.2018.8541636
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