Important advances towards application of a cryogenic X-ray detector based on superconducting tunnel junctions were achieved. In a first time industrial application, a detector was integrated into the prototype of the cryogenic X-ray spectometer Polaris which is currently used for material analysis at an electron microscop of semiconductor company Infineon. Even during this first test measurement, an energy resolution of about 35 eV at an X-ray energy of 1.5 keV and a count rate of about 300 events per second could be achieved. General restrictions for the application of this kind of detector could not be found. Prerequisite for this experiment was the review of several questions relevant for application. This has partially been accomplished by detector characterisation measurements performed at the electron storage ring BESSY II. On basis of these characterisation measurements a physical model of energy transpotation processes within the detector and a formalism for description of detector response was developed. With this formalism, complex energy dependecies of detector response, which have been described during this work for the first time, could be corrected completely. Additionally, this model allows for a qualitative understanding of detector artefacts, meaning certain classes of events with deviant detector response, again identified during this work for the first time, and for an assignment to different energy transport and loss processes within the detector. Means for an almost perfect suppression of detector artefacts could be developed. Furthermore, interaction with air could be identified as the cause for a detector degradation that had already been observed earlier. Not until a reproducable fabrication method and a secure storing method for detectors had evolved from this insight the application of these detectors at BESSY and the electron microscope could be realised. Owing to these investigations, the detector fulfils all relevant prerequisites for application.
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Important advances towards application of a cryogenic X-ray detector based on superconducting tunnel junctions were achieved. In a first time industrial application, a detector was integrated into the prototype of the cryogenic X-ray spectometer Polaris which is currently used for material analysis at an electron microscop of semiconductor company Infineon. Even during this first test measurement, an energy resolution of about 35 eV at an X-ray energy of 1.5 keV and a count rate of about 300 eve...
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