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- Titel:
A Comprehensive Investigation of Cryogenic Aging in 28nm CMOS: Suppression of BTI and HCD in Circuits and SRAM
- Dokumenttyp:
- Konferenzbeitrag
- Autor(en):
- Diaz-Fortuny, Javier; Benkhelifa, Mahdi; Alexander, Grill1; Bury, Erik; Degraeve, Robin; Kaczer, Ben; Amrouch, Hussam
- Kongress- / Buchtitel:
- Proceedings of the IEEE 61st International Reliability Physics Symposium (IRPS'25)
- Jahr:
- 2025
BibTeX
Vorkommen:
- mediaTUM GesamtbestandHochschulbibliographie2025Integrated Research CentersMunich Institute of Robotics and Machine Intelligence (MIRMI) - The AI Mission Institute (AIM)
- mediaTUM GesamtbestandEinrichtungenSchools TUM School of Computation, Information and TechnologyDepartmentsComputer EngineeringAI Processor Design (Prof. Amrouch)