Kar, Anirban;Mema, Albi;Benkhelifa, Mahdi;Amrouch, Hussam
Beyond FinFETs: Transistor-to-GDS Benchmarking of AI Accelerators using Nanosheets and CFETs
IEEE International Symposium on VLSI Design, Automation and Test (VLSI-TSA'25)
2025

Benkhelifa, Mahdi;Amrouch, Hussam
SRAM Beyond FinFET: Performance and Aging Challenges in Nanosheet and CFET
IEEE Computer Society Annual Symposium on VLSI (ISVLSI'25)
2025

Jafarzadeh, Hanieh;Klemme, Florian;Amrouch, Hussam;Hellebrand, Sybille;Wunderlich, Hans-Joachim
Robust DLBIST for Delay Fault Testing: Minimizing PVT Variability with Zero Temperature Coefficient (ZTC) Voltage
IEEE Latin American Test Symposium (LATS'24)
2025

Kar, Anirban;Benkhelifa, Mahdi;Chauhan, Yogesh;Amrouch, Hussam
Performance Evaluation of 6T-SRAM in Sub-3 nm Complementary FET
IEEE Electron Devices Technology & Manufacturing Conference (EDTM'25)
2025

Benkhelifa, Mahdi;Parihar, Shivendra;Kar, Anirban;Pahwa, Girish;Chauhan, Yogesh S.;Amrouch, Hussam
Frontiers in Edge AI with RISC-V: Quantized Neural Networks vs. Hyperdimensional Computing
Proceedings of the Conference on Design, Automation & Test in Europe (DATE'25)
2025

Diaz-Fortuny, Javier;Benkhelifa, Mahdi;Alexander, Grill1;Bury, Erik;Degraeve, Robin;Kaczer, Ben;Amrouch, Hussam
A Comprehensive Investigation of Cryogenic Aging in 28nm CMOS: Suppression of BTI and HCD in Circuits and SRAM
Proceedings of the IEEE 61st International Reliability Physics Symposium (IRPS'25)
2025

Kar, Anirban;Parihar, Shivendra;Klemme, Florian;Chauhan, Yogesh;Amrouch, Hussam
Benchmarking Cryogenic Circuits Using 5 nm FinFETs for Quantum Processing
Proceedings of the IEEE International Symposium on Circuits and Systems (ISCAS'25)
2025

Pöhls, Leticia PÖHLS;Chinazzo, André L.;Benkhelifa, Mahdi;Kar, Anirban;Krstic, Milos;Amrouch, Hussam
Heterogeneous Integration of Advanced CMOS and Emerging Memories: Challenges and Solutions
IEEE European Test Symposium (ETS'25)
2025

Vargas, Fabian;Krstic, Milos;Amrouch, Hussam;Tille, Daniel;Huhn, Sebastian
Self-Aware Silicon: Enhancing Lifecycle Management with Intelligent Testing an Data Insightsn
IEEE European Test Symposium (ETS'25)
2025

Panteleaki, Aikaterini;Balaskas, Kostas;Zervakis, Georgios;Amrouch, Hussam;Anagnostopoulos, Iraklis
Carbon-Efficient 3D DNN Acceleration: Optimizing Performance and Sustainability
IEEE Computer Society Annual Symposium on VLSI (ISVLSI'25)
2025