Kaden, Janik;Hilger, Maximilian;Schreiter, Tim;Schaab, Marius;Graichen, Thomas;Rudenko, Andrey;Heinkel, Ulrich;Lilienthal, Achim J.
Collecting Human Motion Data in Large and Occlusion-Prone Environments using Ultra-Wideband Localization
2025 International Conference on Robotics and Automation (ICRA): 7th Workshop on Long-term Human Motion Prediction (LHMP)
2025

Wei, Wenxuan;Xu, Xiao;Nockenberg, Lars;Rodriguez-Guevara, Daniel;Oezsert Duran, Selin Nur;Prattichizzo, Domenico;Steinbach, Eckehard
Perceptual Coding of High-Resolution Fingertip Tactile Feedback
European WIRELESS 2025; 30th European Wireless Conference
2025

Hilger, Maximilian;Adolfsson, Daniel;Becker, Ralf;Andreasson, Henrik;Lilienthal, Achim J.
Detecting Loop Closures in 4D Radar SLAM
1st German Robotics Conference
2025

Kar, Anirban;Mema, Albi;Benkhelifa, Mahdi;Amrouch, Hussam
Beyond FinFETs: Transistor-to-GDS Benchmarking of AI Accelerators using Nanosheets and CFETs
IEEE International Symposium on VLSI Design, Automation and Test (VLSI-TSA'25)
2025

Benkhelifa, Mahdi;Amrouch, Hussam
SRAM Beyond FinFET: Performance and Aging Challenges in Nanosheet and CFET
IEEE Computer Society Annual Symposium on VLSI (ISVLSI'25)
2025

Amrouch, Hussam
Thermal Challenges beyond FinFET
IEEE/ACM International Symposium on Low Power Electronics and Design (ISLPED'25)
2025

Jafarzadeh, Hanieh;Klemme, Florian;Amrouch, Hussam;Hellebrand, Sybille;Wunderlich, Hans-Joachim
Robust DLBIST for Delay Fault Testing: Minimizing PVT Variability with Zero Temperature Coefficient (ZTC) Voltage
IEEE Latin American Test Symposium (LATS'24)
2025

Kar, Anirban;Benkhelifa, Mahdi;Chauhan, Yogesh;Amrouch, Hussam
Performance Evaluation of 6T-SRAM in Sub-3 nm Complementary FET
IEEE Electron Devices Technology & Manufacturing Conference (EDTM'25)
2025

Benkhelifa, Mahdi;Parihar, Shivendra;Kar, Anirban;Pahwa, Girish;Chauhan, Yogesh S.;Amrouch, Hussam
Frontiers in Edge AI with RISC-V: Quantized Neural Networks vs. Hyperdimensional Computing
Proceedings of the Conference on Design, Automation & Test in Europe (DATE'25)
2025

Diaz-Fortuny, Javier;Benkhelifa, Mahdi;Alexander, Grill1;Bury, Erik;Degraeve, Robin;Kaczer, Ben;Amrouch, Hussam
A Comprehensive Investigation of Cryogenic Aging in 28nm CMOS: Suppression of BTI and HCD in Circuits and SRAM
Proceedings of the IEEE 61st International Reliability Physics Symposium (IRPS'25)
2025