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Title:

TCAD Modeling of ESD Diode Overshoot During Ultrafast TLP Events

Document type:
Zeitschriftenaufsatz
Author(s):
Groppo, Emanuele; Gossner, Harald; Brederlow, Ralf
Journal title:
IEEE Electron Device Letters
Year:
2025
Pages contribution:
1-1
Fulltext / DOI:
doi:10.1109/led.2025.3531797
Publisher:
Institute of Electrical and Electronics Engineers (IEEE)
E-ISSN:
0741-31061558-0563
Date of publication:
01.01.2025
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