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Titel:

High-energy X-ray diffraction experiment employing a compact synchrotron X-ray source based on inverse Compton scattering.

Dokumenttyp:
Journal Article
Autor(en):
Melcher, Johannes; Dierolf, Martin; Günther, Benedikt; Achterhold, Klaus; Pfeiffer, Daniela; Pfeiffer, Franz
Abstract:
X-ray diffraction (XRD) is an important material analysis technique with a widespread use of laboratory systems. These systems typically operate at low X-ray energies (from 5 keV to 22 keV) since they rely on the small bandwidth of K-lines like copper. The narrow bandwidth is essential for precise measurements of the crystal structure in these systems. Inverse Compton X-ray source (ICS) could pave the way to XRD at high X-ray energies in a laboratory setting since these sources provide brilliant...     »
Zeitschriftentitel:
Z Med Phys
Jahr:
2024
Volltext / DOI:
doi:10.1016/j.zemedi.2024.03.003
PubMed:
http://view.ncbi.nlm.nih.gov/pubmed/38631968
Print-ISSN:
0939-3889
TUM Einrichtung:
Institut für Diagnostische und Interventionelle Radiologie (Prof. Makowski)
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