- Title:
Modeling and Benchmarking 5nm Ferroelectric FinFET from Room Temperature down to Cryogenic Temperatures
- Document type:
- Konferenzbeitrag
- Author(s):
- Parihar, Shivendra; Chatterjee, Swetaki; Pahwa, Girish; Chauhan, Yogesh; Amrouch, Hussam
- Book / Congress title:
- IEEE 23rd International Conference on Nanotechnology (NANO)
- Year:
- 2023
- Month:
- 06
- Fulltext / DOI:
- doi:10.36227/techrxiv.23292647.v1
- BibTeX