- Titel:
Modeling and Benchmarking 5nm Ferroelectric FinFET from Room Temperature down to Cryogenic Temperatures
- Dokumenttyp:
- Konferenzbeitrag
- Autor(en):
- Parihar, Shivendra; Chatterjee, Swetaki; Pahwa, Girish; Chauhan, Yogesh; Amrouch, Hussam
- Kongress- / Buchtitel:
- IEEE 23rd International Conference on Nanotechnology (NANO)
- Jahr:
- 2023
- Monat:
- 06
- Volltext / DOI:
- doi:10.36227/techrxiv.23292647.v1
- BibTeX