Login
- Title:
Comprehensive Reliability Analysis of 22nm FDSOI SRAM from Device Physics to Deep Learning
- Document type:
- Konferenzbeitrag
- Author(s):
- Prakash, Om; Novkin, Rodion; Surabhi, Virinchi Roy; Krishnamurthy, Prashanth; Karri, Ramesh; Khorrami, Farshad; Amrouch, Hussam
- Book / Congress title:
- 2023 IEEE International Symposium on Circuits and Systems (ISCAS)
- Year:
- 2023
- Pages:
- 1-5
- Fulltext / DOI:
- doi:10.1109/ISCAS46773.2023.10182096
BibTeX
Occurrences:
- mediaTUM GesamtbestandHochschulbibliographie2023Integrated Research CentersMunich Institute of Robotics and Machine Intelligence (MIRMI)
- mediaTUM GesamtbestandEinrichtungenForschungszentrenMunich Institute of Robotics and Machine Intelligence (MIRMI) - The AI Mission Institute (AIM)