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- Titel:
Comprehensive Reliability Analysis of 22nm FDSOI SRAM from Device Physics to Deep Learning
- Dokumenttyp:
- Konferenzbeitrag
- Autor(en):
- Prakash, Om; Novkin, Rodion; Surabhi, Virinchi Roy; Krishnamurthy, Prashanth; Karri, Ramesh; Khorrami, Farshad; Amrouch, Hussam
- Kongress- / Buchtitel:
- 2023 IEEE International Symposium on Circuits and Systems (ISCAS)
- Jahr:
- 2023
- Seiten:
- 1-5
- Volltext / DOI:
- doi:10.1109/ISCAS46773.2023.10182096
BibTeX
Vorkommen:
- mediaTUM GesamtbestandEinrichtungenSchools TUM School of Computation, Information and TechnologyDepartmentsComputer EngineeringAI Processor Design (Prof. Amrouch)
- mediaTUM GesamtbestandHochschulbibliographie2023Schools und FakultätenTUM School of Computation, Information and TechnologyAI Processor Design (Prof. Amrouch)