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- Document type:
- Konferenzbeitrag
- Author(s):
- Kaja, Endri; Gerlin, Nicolas; Vaddeboina, Mounika; Rivas, Luis; Prebeck, Sebastian Siegfried; Han, Zhao; Devarajegowda, Keerthikumara; Ecker, Wolfgang
- Title:
- Towards Fault Simulation at Mixed Register-Transfer/Gate-Level Models
- Book / Congress title:
- IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems
- Year:
- 2021
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