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- Titel:
Towards Fault Simulation at Mixed Register-Transfer/Gate-Level Models
- Dokumenttyp:
- Konferenzbeitrag
- Autor(en):
- Kaja, Endri; Gerlin, Nicolas; Vaddeboina, Mounika; Rivas, Luis; Prebeck, Sebastian Siegfried; Han, Zhao; Devarajegowda, Keerthikumara; Ecker, Wolfgang
- Kongress- / Buchtitel:
- IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems
- Jahr:
- 2021
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