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Title:

Characterizing magnetic field-coupled computing devices by the Extraordinary Hall Effect

Document type:
Konferenzbeitrag
Author(s):
Becherer, M.; Kiermaier, J.; Csaba, G.; Rezgani, J.; Yilmaz, C.; Osswald, P.; Lugli, P.; Schmitt-Landsiedel, D.
Abstract:
A submicron sized extraordinary Hall-effect (EHE) sensor for read-out of field-coupled computing devices is presented. The applied sensing structure is suitable to electrically probe the output states of field-coupled magnetic logic gates. Furthermore it reveals details on the magnetic properties of submicron-scale single-domain dots. A `split-current' architecture is chosen, where Hall-sensing takes place in a single lateral direction, in order to keep field-coupling to adjacent nanomagnets und...     »
Book / Congress title:
European Solid State Electronic Device Research Conference ESSDERC
Congress (additional information):
Athens, Greece, Sep 14 - 18, 2009-09
Year:
2009
Quarter:
3. Quartal
Year / month:
2009-09
Month:
Sep
Language:
en
Fulltext / DOI:
doi:10.1109/ESSDERC.2009.5331551
WWW:
http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=5331551
Format:
Text
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