Vertical interconnect structure, memory device and associated production method
Dokumenttyp:
Patent
Patent, Gebrauchsmuster Nr.:
US 9177995 B2
Erfinder:
Martin Gutsche; Franz Kreupl; Harald Seidl
Patentanmelder:
Martin Gutsche; Franz Kreupl; Harald Seidl
Abstract:
The present invention relates to a method for producing a vertical interconnect structure, a memory device and an associated production method, in which case, after the formation of a contact region in a carrier substrate a catalyst is produced on the contact region and a free-standing electrically conductive nanoelement is subsequently formed between the catalyst and the contact region and embedded in a dielectric layer.