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- Titel:
An X-ray microtomography-based method for detailed analysis of the three-dimensional morphology of fungal pellets: Aspergillus niger as case study
- Dokumenttyp:
- Konferenzbeitrag
- Art des Konferenzbeitrags:
- Poster
- Autor(en):
- Barthel, L.; Schmideder, S.; Briesen, H.; Meyer, V.
- Kongress- / Buchtitel:
- 13th Symposium of the VAAM Special Group -- Biology and Biotechnology of Fungi
- Verlagsort:
- Göttingen, Germany
- Jahr:
- 2019
- TUM Einrichtung:
- Process Systems Engineering, TUM
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