Learning Temporal Specifications from Imperfect Traces Using Bayesian Inference

Title:: Learning Temporal Specifications from Imperfect Traces Using Bayesian Inference
Document type:: Konferenzbeitrag
Author(s):: Mrowca, Artur; Nocker, Martin; Steinhorst, Sebastian; Günnemann, Stephan
Book / Congress title:: Proceedings of the 56th Annual Design Automation Conference 2019 on - DAC '19
Publisher:: ACM Press
Date of publication:: 01.01.2019
Year:: 2019
Print-ISBN:: 9781450367257
Fulltext / DOI:: doi:10.1145/3316781.3317847
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