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Titel:

A resistor network simulation model for laser-scanning photo-current microscopy to quantify low conductance regions in organic thin films

Dokumenttyp:
Zeitschriftenaufsatz
Autor(en):
Darwish, M.; Boysan, H.; Liewald, C.; Nickel, B.; Gagliardi, A.
Abstract:
Organic field effect transistors (OFETs) show considerable variation from device to device and batch to batch. For the basic understanding of the microscopic origins of these variations, it is crucial to develop both experimental and theoretical methods that allow to localize ineffective regions in a device. Raster techniques, which manipulate conductivity locally, combined with global current readout may provide this information, e.g. it has been suggested that diffraction limited illumination...     »
Stichworte:
OFETs SPCM Resistor networks Spot illumination Trap densities
Zeitschriftentitel:
Organic Electronics Available online 7 August In Press, Accepted Manuscript 2018-08
Jahr:
2018
Jahr / Monat:
2018-08
Quartal:
3. Quartal
Monat:
Aug
Sprache:
en
Volltext / DOI:
doi:10.1016/j.orgel.2018.08.002
WWW:
https://www.sciencedirect.com/science/article/pii/S1566119918304063
Verlag / Institution:
Elsevier B.V.
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