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- Author(s):
- Hein, J.; Hippeli, J.; Eibert, T. F.
- Title:
- Reduction of {EMC} {Simulation} {Efforts} {Using} {Design} of {Experiments}
- Book / Congress title:
- {IEEE} {International} {Conference} on {Signal} and {Power} {Integrity}
- Publisher address:
- National Harbor, MD, USA
- Year:
- 2017
- Month:
- aug
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