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Document type:
Konferenzbeitrag 
Author(s):
Kiesel, Sebastian; Kern, Thomas; Wicht, Bernhard; Graeb, Helmut 
Title:
A 30ns 16Mb 2b/cell Embedded Flash with Ramped Gate Time-Domain Sensing Scheme for Automotive Application 
Book / Congress title:
International Symposium on VLSI Design, Automation and Test (VLSI-DAT) 
Year:
2019 
Month:
April