Glocker, Elisabeth;Boppu, Srinivas;Chen, Qingqing;Schlichtmann, Ulf;Teich, Jürgen;Schmitt-Landsiedel, Doris.Temperature Modeling and Emulation of an ASIC Temperature Monitor System for Tightly-Coupled Processor Arrays (TCPAs).Advances in Radio Science.2014.12.103--109

Glocker, Elisabeth;Chen, Qingqing;Zaidi, Asheque;Schlichtmann, Ulf;Schmitt-Landsiedel, Doris.Emulierung eines ASIC-Leistungsverbrauchs- und Temperaturmonitorsystems für FPGA-Prototyping eines ressourcengewahren Computersystems.16. Workshop Analogschaltungen.2014

Schlichtmann, Ulf;Kleeberger, Veit B.;Abraham, Jacob A.;Evans, Adrian;Gimmler-Dumont, Christina;Glaß, Michael;Herkersdorf, Andreas;Nassif, Sani R.;Wehn, Norbert.Connecting Different Worlds – Technology Abstraction for Reliability-Aware Design and Test.Design, Automation and Test in Europe (DATE).2014

Miller, Felix;Todorov, Vladimir;Wild, Thomas;Mueller-Gritschneder, Daniel;Herkersdorf, Andreas;Schlichtmann, Ulf.A TSV-Property-aware Synthesis Method for Application-Specific 3D-NoCs Design.Design Automation and Test in Europe (DATE), Friday Workshop on 3D Integration.2014

Linder, Michael;Eder, Alfred;Oberländer, Klaus;Schlichtmann, Ulf.An Analysis of Industrial SRAM Test Results—A Comprehensive Study on Effectiveness and Classification of March Test Algorithms.IEEE Design and Test.2014.may

Chou, Pang-Yen;Graeb, Helmut.Platzierung von Kapazitäts-Arrays: ein konstruktiver Ansatz.edaWorkshop.2014

Boos, Anja;Ramini, Luca;Bertozzi, Davide;Schlichtmann, Ulf.Ein Platzier- und Verdrahtungsalgorithmus für Optische Networks-on-Chip zur Minimierung der Einfügedämpfung.edaWorkshop.2014

Kleeberger, Veit B.;Dorfner, Magdalena;Schlichtmann, Ulf.Evaluation of Sequential Circuit Resilience in Early Design Stages.edaWorkshop.2014

Glocker, Elisabeth;Chen, Qingqing;Zaidi, Asheque M.;Schlichtmann, Ulf;Schmitt-Landsiedel, Doris.Emulated ASIC Power and Temperature Monitor System for FPGA Prototyping of an Invasive MPSoC Computing Architecture.Proceedings of the 1st Workshop on Resource Awareness and Adaptivity in Multi-Core Computing (Racing 2014).2014

Lorenz, Dominik;Barke, Martin;Schlichtmann, Ulf.Monitoring of Aging in Integrated Circuits by Identifying Possible Critical Paths.Microelectronics Reliability.2014.54.6-7.jun.1075-1082