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Author(s):
Kleeberger, Veit B.; Barke, Martin; Werner, Christoph; Schmitt-Landsiedel, Doris; Schlichtmann, Ulf 
Title:
A Compact Model for NBTI Degradation and Recovery under Use-Profile Variations and its Application to Aging Analysis of Digital Integrated Circuits 
Journal title:
Microelectronics Reliability 
Year:
2014 
Journal volume:
54 
Month:
jun 
Journal issue:
6-7 
Pages contribution:
1083-1089