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Document type:
Konferenzbeitrag
Author(s):
Juergens, Elmar; Deissenboeck, Florian; Feilkas, Martin; Hummel, Benjamin; Schaetz, Bernhard; Wagner, Stefan; Domann, Christoph; Streit, Jonathan
Title:
Can clone detection support quality assessments of requirements specifications?
Book / Congress title:
Proceedings of the 32nd ACM/IEEE International Conference on Software Engineering - Volume 2
Publisher:
ACM
Date of publication:
01.05.2010
Year:
2010
Fulltext / DOI:
doi:10.1145/1810295.1810308
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