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Document type:
Zeitschriftenaufsatz 
Author(s):
Pellegrino, C.; Gagliardi, A.; Zimmermann, C.G. 
Title:
Defect spectroscopy and non-ionizing energy loss analysis of proton and electron irradiated p-type GaAs solar cells 
Abstract:
Admittance spectroscopy combined with non-ionizing energy loss (NIEL) analysis is shown to be a powerful tool for analyzing solar cell radiation degradation, not relying on the change of macroscopic cell parameters. GaAs component cells, representative of the middle sub-cell in Ga0.5In0.5P/GaAs/Ge solar cells, were irradiated with protons and electrons in the 0.5–3 MeV energy range. Four irradiation-induced defects are identified in the p-type base layer. The nature of each defect is assessed by...    »
 
Journal title:
Journal of Applied Physics 128, 195701 (2020) 2020-11 
Year:
2020 
Year / month:
2020-11 
Quarter:
4. Quartal 
Month:
Nov 
Language:
en 
Fulltext / DOI:
Publisher:
AIP