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Titel:

Defect spectroscopy and non-ionizing energy loss analysis of proton and electron irradiated p-type GaAs solar cells

Dokumenttyp:
Zeitschriftenaufsatz
Autor(en):
Pellegrino, C.; Gagliardi, A.; Zimmermann, C.G.
Abstract:
Admittance spectroscopy combined with non-ionizing energy loss (NIEL) analysis is shown to be a powerful tool for analyzing solar cell radiation degradation, not relying on the change of macroscopic cell parameters. GaAs component cells, representative of the middle sub-cell in Ga0.5In0.5P/GaAs/Ge solar cells, were irradiated with protons and electrons in the 0.5–3 MeV energy range. Four irradiation-induced defects are identified in the p-type base layer. The nature of each defect is assessed by...     »
Zeitschriftentitel:
Journal of Applied Physics 128, 195701 2020-11
Jahr:
2020
Jahr / Monat:
2020-11
Quartal:
4. Quartal
Monat:
Nov
Sprache:
en
Volltext / DOI:
doi:10.1063/5.0028029
WWW:
https://aip.scitation.org/doi/full/10.1063/5.0028029
Verlag / Institution:
AIP
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