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Title:

A model and sensitivity analysis of the quality economics of defect-detection techniques

Document type:
Konferenzbeitrag
Author(s):
Wagner, Stefan
Book / Congress title:
Proceedings of the 2006 international symposium on Software testing and analysis
Publisher:
ACM
Date of publication:
21.07.2006
Year:
2006
Fulltext / DOI:
doi:10.1145/1146238.1146247
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