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Document type:
Zeitschriftenaufsatz
Author(s):
Niedermayr, Rainer; Röhm, Tobias; Wagner, Stefan
Title:
Too trivial to test? An inverse view on defect prediction to identify methods with low fault risk
Journal title:
PeerJ Computer Science
Year:
2019
Journal volume:
5
Pages contribution:
e187
Publisher:
PeerJ Inc.
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