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- Document type:
- Konferenzbeitrag
- Author(s):
- Polian, Ilia; Anders, Jens; Becker, Steffen; Bernardi, Paolo; Chakrabarty, Krishnendu; ElHamawy, Nourhan; Sauer, Matthias; Singh, Adit; Reorda, Matteo Sonza; Wagner, Stefan
- Title:
- Exploring the Mysteries of System-Level Test
- Book / Congress title:
- 2020 IEEE 29th Asian Test Symposium (ATS)
- Year:
- 2020
- Pages:
- 1-6
- Fulltext / DOI:
- doi:10.1109/ATS49688.2020.9301557
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