In situ polarised neutron reflectometry is a novel powerful analysis technique, which can unveil many of the key properties of magnetic thin films during their process of growth. In this work, the technique was developed to maturity, which allows investigations of a variety of thin film materials to be performed. In addition, the thin film heterostructures Tb/Dy, La0.67Sr0.33MnO3/BaTiO3 and EuO/BaO, which might exhibit promising properties for spintronic applications like exchange bias and multiferroism, were explored.
«
In situ polarised neutron reflectometry is a novel powerful analysis technique, which can unveil many of the key properties of magnetic thin films during their process of growth. In this work, the technique was developed to maturity, which allows investigations of a variety of thin film materials to be performed. In addition, the thin film heterostructures Tb/Dy, La0.67Sr0.33MnO3/BaTiO3 and EuO/BaO, which might exhibit promising properties for spintronic applications like exchange bias and multi...
»