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Title:

Empirical modeling of the refractive index for (AlGaIn)As lattice matched to InP

Document type:
Zeitschriftenaufsatz
Author(s):
Grasse, C., Böhm, G., Müller, M., Gründl, T., Meyer, R., Amann, M. C.
Journal title:
Semiconductor science and technology
Year:
2010
Year / month:
2010-03
Quarter:
1. Quartal
Month:
Mar
Journal issue:
25/4
Reviewed:
ja
Language:
en
Fulltext / DOI:
doi:doi:10.1088/0268-1242/25/4/045018
WWW:
http://iopscience.iop.org/0268-1242/25/4/045018/
Status:
published (reviewed)
Semester:
SS 02
TUM Institution:
Lehrstuhl für Halbleitertechnologie (E26)
Format:
Text
 BibTeX