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- Title:
A 65nm test structure for the analysis of NBTI induced statistical variation in SRAM transistors
- Document type:
- Zeitschriftenaufsatz
- Author(s):
- Fischer, Thomas; Amirante, Ettore; Hofmann, Karl; Ostermayr, Martin; Huber, Peter; Schmitt-Landsiedel, Doris
- Journal title:
- Proc. of ESSDERC
- Year:
- 2008
- Pages contribution:
- 51-54
- Language:
- de
- TUM Institution:
- Lehrstuhl für Technische Elektronik
- Format:
- Text
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