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Title:

A 65nm test structure for the analysis of NBTI induced statistical variation in SRAM transistors

Document type:
Zeitschriftenaufsatz
Author(s):
Fischer, Thomas; Amirante, Ettore; Hofmann, Karl; Ostermayr, Martin; Huber, Peter; Schmitt-Landsiedel, Doris
Journal title:
Proc. of ESSDERC
Year:
2008
Pages contribution:
51-54
Language:
de
TUM Institution:
Lehrstuhl für Technische Elektronik
Format:
Text
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