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Document type:
Zeitschriftenaufsatz 
Author(s):
Prey, L.; Schmidhalter, U. 
Title:
Deep Phenotyping of Yield-Related Traits in Wheat 
Journal title:
Agronomy 
Year:
2020 
Journal volume:
10 
Journal issue:
Pages contribution:
603 
Language:
en 
Fulltext / DOI:
Publisher:
MDPI AG 
E-ISSN:
2073-4395 
Date of publication:
23.04.2020