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- Title:
Analysis of read current and write trip voltage variability from a 1 MBit SRAM test structure
- Document type:
- Zeitschriftenaufsatz
- Author(s):
- Fischer, Thomas; Amirante, Ettore; Huber, Peter; Nirschl, Thomas; Olbrich, Alexander; Ostermayr, Martin; Schmitt-Landsiedel, Doris
- Journal title:
- IEEE Transactions on Semiconductor Manufacturing
- Year:
- 2008
- Journal volume:
- 21
- Journal issue:
- 4
- Language:
- en
- TUM Institution:
- Lehrstuhl für Technische Elektronik
- Format:
- Text
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