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Title:

Analysis of read current and write trip voltage variability from a 1 MBit SRAM test structure

Document type:
Zeitschriftenaufsatz
Author(s):
Fischer, Thomas; Amirante, Ettore; Huber, Peter; Nirschl, Thomas; Olbrich, Alexander; Ostermayr, Martin; Schmitt-Landsiedel, Doris
Journal title:
IEEE Transactions on Semiconductor Manufacturing
Year:
2008
Journal volume:
21
Journal issue:
4
Language:
en
TUM Institution:
Lehrstuhl für Technische Elektronik
Format:
Text
 BibTeX