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- Titel:
Soft Error Analysis in Nanosheet and Forksheet Transistors: From Device Physics to Circuit and Memory Impact
- Dokumenttyp:
- Zeitschriftenaufsatz
- Autor(en):
- Raza, Hafeez; Lahgere, Avinash; Amrouch, Hussam
- Zeitschriftentitel:
- IEEE Transactions on Electron Devices (TED)
- Jahr:
- 2026
BibTeX
Vorkommen:
- mediaTUM GesamtbestandHochschulbibliographie2026Integrated Research CentersMunich Institute of Robotics and Machine Intelligence (MIRMI) - The AI Mission Institute (AIM)
- mediaTUM GesamtbestandEinrichtungenSchools TUM School of Computation, Information and TechnologyDepartmentsComputer EngineeringAI Processor Design (Prof. Amrouch)