Jafarzadeh, Hanieh;Reimer, Jan Dennis;Amrouch, Hussam;Hellebrand, Sybille;Wunderlich, Hans-Joachim
Validating Statistical Delay Test Generation under Timing Variations via SAT-Based ATPG
IEEE Latin American Test Symposium (LATS'26)
2026

Raj Karn, Rupesh;Genssler, Paul;Amrouch, Hussam;Sinanoglu, Ozgur
Securing Hyper-Dimensional Computing: A Locking Mechanism with FPGA Implementation
International Conference on Information Systems Security and Privacy (ICISSP'26)
2026

Amrouch, Hussam;Milojevic, Dragomir;Toublanc, Jerome;Di Natale, Giorgio
Challenges and Perspectives in Advanced CMOS & 5.5D Packaging: Design, Reliability and Security
Proceedings of the Conference on Design, Automation & Test in Europe (DATE'26)
2026

Benkhelifa, Mahdi;Deshwal, Swati;Leon, Mayr;S. Chauhan, Yogesh;Amrouch, Hussam
Revealing the Impact of Parasitic Effects on CFET Reliability and Performance Across Devices, Standard Cells, and Circuits
Proceedings of the IEEE 60th International Reliability Physics Symposium (IRPS'26)
2026

Nabeel, Mohammed;Hadi Nour, Eddine;Eddine Benkhelifa, Mehadi Mahi;Sinanoglu, Ozgur;Maniatakos, Michail;Amrouch, Hussam
Power Side-Channel Attacks in Nanosheet Circuits
Proceedings of the IEEE International Symposium on Circuits and Systems (ISCAS'26)
2026

Hu, Yuting;Mohamed, Tarek;Xu, Chenhui;Xiang, Hua;Amrouch, Hussam;Nam, Gi-Joon;Xiong, Jinjun
Si-GT: Fast Interconnect Signal Integrity Analysis for Integrated Circuit Design via Graph Transformers
The Fourteenth International Conference on Learning Representations (ICLR'26)
2026

Raza, Hafeez;Lahgere, Avinash;Amrouch, Hussam
Soft Error Analysis in Nanosheet and Forksheet Transistors: From Device Physics to Circuit and Memory Impact
IEEE Transactions on Electron Devices (TED)
2026