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- Title:
Too trivial to test? An inverse view on defect prediction to identify methods with low fault risk
- Document type:
- Zeitschriftenaufsatz
- Author(s):
- Niedermayr, Rainer; Röhm, Tobias; Wagner, Stefan
- Journal title:
- PeerJ Computer Science
- Year:
- 2019
- Journal volume:
- 5
- Pages contribution:
- e187
- Publisher:
- PeerJ Inc.
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